Work

The Effect of Epoxy Resin Cracking Under Low Temperature-Stress Coupling Action on its Electrical Properties

Year: 2024

Type: conference-paper

Source: International Conference on Power and Energy Applications (ICPEA)

DOI: 10.1109/icpea63589.2024.10784532

Authors: Zhengnan Chi, Yunxiao Zhang, Yuxiang Chen, Jiarui Zhang, Wenxin Lin, Yanfeng Gao

Institutions: Fuzhou University, State Grid Corporation of China (China)

Language: English

Topic: High voltage insulation and dielectric phenomena

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Science and Technology Project of State Grid

Award: G8410500451

OpenAlex ID: W4405601055

FWCI: 1.955

Cites: 12

Cited by: 1

Related to: 10