The Assessment of Contact Conditions in Vacuum Circuit Breakers using Field Emission Current Measurement
Year: 2024
Type: conference-paper
Authors: Yun Geng, Xiaofei Yao, Xinggui Chen, Shengquan Mu, Yingsan Geng, Zhiyuan Liu
Language: English
Topic: Vacuum and Plasma Arcs
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405601288
