Life Cycle State Evaluation of Auxiliary Circuit-Breaker in Synthetic Test Circuit Based on Dynamic Contact Resistance
Year: 2024
Type: conference-paper
Authors: Duifeng Yan, Yantao Shen, Dejun Zhu, Jiru Wang, Xingyu Lin, Jiaxin Wang, Shenli Jia, Shixin Xiu
Institution: Xi'an Jiaotong University
Language: English
Subfield: Mechanical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405601426
