Work

Neutron Radiation-Induced Failure Rate of 650 V Lateral GaN Power Devices

Year: 2024

Type: conference-paper

DOI: 10.1109/wipdaeurope62087.2024.10797418

Authors: Leon Fauth, Christian Beckemeier, Maximilian Goller, Josef Lutz, Thomas Basler, Jens Friebe

Institutions: Leibniz University Hannover, Chemnitz University of Technology, University of Kassel

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Deutsche Forschungsgemeinschaft

Award: G1498198591

OpenAlex ID: W4405601592

FWCI:

Cites: 3

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Related to: 10