A Short Circuit Testing and Ruggedness Study of Latest SiC MOSFETs
Year: 2024
Type: conference-paper
Authors: Usman Nasir, Jixuan Wei, Alex George, Mark Bowkett, Ubaid Akbar, Gerardo Calderon-Lopez, Ingo Lüdtke
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405601876