Field Enhancement and Vacuum Breakdown Caused by Micro-Particles Induction in High Voltage
Year: 2024
Type: conference-paper
Authors: Yulong Gao, Shichen Deng, Wendi Xu, Yuanzhao Li, Hui Ma, Yingsan Geng, Jianhua Wang
Language: English
Topic: Vacuum and Plasma Arcs
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405602237
