Work

SmallNet: A Small Defects Detection Network for Magnetic Chips Based on Context-Weighted Aggregation and Feature Multiscale Loop Fusion

Year: 2024

Type: article

Source: IEEE Transactions on Automation Science and Engineering

DOI: 10.1109/tase.2024.3517537

Authors: Weijian Liang, Yaoru Sun, Siyu Zhang, Lizhi Bai, Jun Yang

Institution: Tongji University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405632149

FWCI: 1.249

Cites: 44

Cited by: 6

Related to: 10