Field Verification of Fault Localization with Integrated Physical-Parameter-Aware Methodology
Year: 2024
Type: conference-paper
Source: IEEE Photonics Conference
Authors: Hideki Nishizawa, Giacomo Borraccini, Takeo Sasai, Yue-Kai Huang, Toru Mano, Kazuya Anazawa, Masatoshi Namiki, Soichiroh Usui, Tatsuya Matsumura, Yoshiaki Sone, Zehao Wang, Seiji Okamoto, Takeru Inoue, Ezra Ip, Andrea D’Amico, Tingjun Chen, Vittorio Curri, Ting Wang, Koji Asahi, Tomoaki Yoshida, Koichi Takasugi
Institutions: NTT (Japan), Duke University, Politecnico di Torino, NEC (Japan)
Language: English
Topic: Optical Network Technologies
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405633144