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A Few-Shot Complex Chip Defect Detection Algorithm Guided by Priori Boxes

Year: 2024

Type: conference-paper

DOI: 10.1109/ssitcon62437.2024.10796416

Authors: Bing-qi Wang, Bin Yang, Jian Wang, Jian Liu, Zhi-cheng Wang, Xiao Wang, Zi-Yi He

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Shanghai Municipal Commission of Economy and Informatization, Research and Development

OpenAlex ID: W4405633336

FWCI: 0.743

Cites: 9

Cited by: 1

Related to: 10