Work

Si-Based GeSn 320×256 Focal Plane Array for Shrot-Wave Infrared Imaging

Year: 2024

Type: conference-paper

Source: IEEE Photonics Conference

DOI: 10.1109/ipc60965.2024.10799550

Authors: Guoyin Xu, Hui Cong, Rui Pan, Xiaoyu Wang, Lin Shen, Yue Li, Yixin Wang, Chao Zhao, Hong Lu, Chi Xu, Chunlai Xue

Institutions: Chinese Academy of Sciences, Institute of Semiconductors, Nanjing University

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Chinese Academy of Sciences

OpenAlex ID: W4405633469

FWCI:

Cites: 5

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