Work

Towards an Enhanced Metrology Analysis Procedure for Assessing Position Accuracy of Edge-Emitting Lasers to Photonic Integrated Circuits

Year: 2024

Type: conference-paper

Source: IEEE Photonics Conference

DOI: 10.1109/ipc60965.2024.10799691

Authors: Jakob Wilhelm Hinum-Wagner, Jochen Kraft, Victor Sidorov, Samuel Hoermann, Gandolf Feigl, Alexander Bergmann

Institutions: AMS (Austria), Graz University of Technology

Language: English

Topic: Semiconductor Lasers and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405633638

FWCI: 0.806

Cites: 4

Cited by: 1

Related to: 10