Work

Analyzing the Change in the Composition of a CdTe Surface upon Implanting $$O_{2}^{ + }$$ Ions and Subsequent Annealing

Year: 2024

Type: article

Source: Bulletin of the Russian Academy of Sciences Physics

DOI: 10.1134/s1062873824708353

Authors: A. A. Abduvayitov, Kh. Kh. Boltaev, B. E. Umirzakov, D. A. Tashmukhamedova, G. Abdurakhmanov

Institutions: Tashkent State Technical University named after Islam Karimov, National University of Uzbekistan

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405707364

FWCI: 0.103

Cites: 21

Cited by: 1

Related to: 10