Work

Avalanche Breakdown in the Base-Emitter- Shorted Silicon Avalanche Transistor Affected by Voltage Ramp

Year: 2024

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2024.3519056

Authors: Long Hu, Hanqing Qiao, Jiahui Fu, Xiangyu Wang, Huan Wang, Xiaoshuai Wu, Xu Fang

Institutions: Xi'an Jiaotong University, Northwest Institute of Nuclear Technology

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Foundation for Research, Science and Technology

Award: G5998438249

OpenAlex ID: W4405718207

FWCI: 0.514

Cites: 36

Cited by: 5

Related to: 10