A Systematic Study of Charge-Trapping Phenomenon in FeFET on FDSOI via Low-Frequency Noise Spectroscopy
Year: 2024
Type: article
Source: IEEE Electron Device Letters
Authors: Qingxiao Zhu, Lihua Xu, Yuan Wang, Yue Zhao, Lingfei Wang, Qing Luo
Institutions: Chinese Academy of Sciences, Institute of Microelectronics
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G5369691468, G7963182041, G8606397282
OpenAlex ID: W4405718264