Work

Direct Evidence of Excessive Charge-Carrier-Induced Degradation in InP Quantum-Dot Light-Emitting Diodes

Year: 2024

Type: article

Source: ACS Applied Materials & Interfaces

DOI: 10.1021/acsami.4c12250

Authors: Hyungsuk Ryu, Doyoon Shin, Beomhee Yoon, Wan Ki Bae, Jeonghun Kwak, Hyunho Lee

Institutions: Kwangwoon University, Sungkyunkwan University, Seoul National University

Language: English

Topic: Quantum Dots Synthesis And Properties

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: Ministry of Trade, Industry and Energy, National Research Foundation of Korea

Awards: G4117409221, G5237450351, G5950587233

OpenAlex ID: W4405730723

FWCI: 2.208

Cites: 48

Cited by: 23

Related to: 10