Work

Characterization of δNi2Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography

Year: 2024

Type: article

Abstract: The strength of a Cu-Ni-Si alloy can be improved by finely dispersing Ni-Si-based compounds as precipitates into the Cu matrix through heat treatment. This requires quantitatively evaluating the size distribution and dispersion state to investigate the strengthening effect of the precipitate. In this work, we utilized transmission electron microscopy, small-angle X-ray scattering (SAXS), small-angle neutron scattering (SANS), and atom probe tomography (APT) to analyze these Ni-Si precipitates. The APT results showed two types of diffusion layers at the interface between the Cu matrix and precipitates. The alloy contrast variation method was used to examine the difference in SAXS and SANS intensity in absolute units, which indicated that the δNi2Si precipitates are distorted.

Source: MATERIALS TRANSACTIONS

DOI: 10.2320/matertrans.mt-d2024005

Authors: Hirokazu Sasaki, Syunta Akiya, Kuniteru Mihara, Yojiro Oba, Masato Onuma, Jun Uzuhashi, Tadakatsu Ohkubo

Institutions: Furukawa Electric (Japan), Furukawa Co., Ltd. (Japan), Toyohashi University of Technology, Hokkaido University, National Institute for Materials Science

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

Funders: Ministry of Education, Culture, Sports, Science and Technology, University of Tokyo, National Institute for Materials Science, Japan Atomic Energy Agency

OpenAlex ID: W4405744674

FWCI: 0.213

Cites: 16

Cited by: 2

Related to: 10