Trap sensitivity of junction and junction-less nano sheet FETs: a comparative study
Year: 2024
Type: article
Source: Physica Scripta
Authors: Manosh Protim Gogoi, Rajesh Saha, Srimanta Baishya
Institution: National Institute Of Technology Silchar
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405744937