Simulation Study of Factor Effect on Transient Thermal Test Performance for Electronic Power Devices
Year: 2024
Type: conference-paper
Source: IEEE CPMT Symposium Japan (ICSJ)
Authors: Nick Chenchao ZHONG, Haibo FAN, Yuning SHI
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405755031