Work

Comparative Analysis of High Stability Soft Error Aware 16T vs. 14T SRAM Cells

Year: 2024

Type: conference-paper

Source: International Conference on Electronics, Communication and Aerospace Technology (ICECA)

DOI: 10.1109/iceca63461.2024.10800990

Authors: Krishna R Marar, L S Krishna Maanas, Sonali Agrawal

Institution: Amrita Vishwa Vidyapeetham

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405755190

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Cites: 12

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Related to: 10