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Welcome Message from the General Chairs and Technical Program Chairs

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)

DOI: 10.1109/metroxraine62247.2024.10796973

Language: English

Topic: Scientific Measurement and Uncertainty Evaluation

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W4405755942

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