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Challenges and Opportunities Applying Laser Beam Scanning Displays Based on Biaxial Resonantly Operated MEMS Scanners

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)

DOI: 10.1109/metroxraine62247.2024.10797201

Authors: Leon Pohl, Oleg Petrak, Jan Berlinski, Marcel Metschulat, Lars Boie, Robert Schmoll, Jakob Studer, Wjatscheslaw Galjan, Andreas Bahr

Institution: Hamburg University of Technology

Language: English

Topic: Advanced MEMS and NEMS Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405756190

FWCI: 1.611

Cites: 16

Cited by: 2

Related to: 10