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Enhancing Resilience in Edge IoT Devices Against Adversarial Attacks

Year: 2024

Type: article

Source: IEEE Consumer Electronics Magazine

DOI: 10.1109/mce.2024.3522524

Authors: Nguyen Khanh Son, Arun Kumar Sangaiah, Darshan Vishwasrao Medhane, Mohammed J. F. Alenazi, Majed Aborokbah

Institutions: National Yunlin University of Science and Technology, National Sun Yat-sen University, King Saud University, University of Tabuk

Language: English

Topic: Adversarial Robustness in Machine Learning

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405778831

FWCI: 0.148

Cites: 22

Cited by: 1

Related to: 10