Work

Direct Measurement of Carrier Distribution in Perovskite by Scanning Capacitance Microscopy

Year: 2024

Type: article

Source: The Journal of Physical Chemistry C

DOI: 10.1021/acs.jpcc.4c06178

Authors: Xirui Liu, Xiaoyi Lu, Xiting Lang, Minghui Li, Yangyang Gou, Yongjie Jiang, Junchuan Zhang, Hao Tian, Yueying Zhang, Herui Xi, Chen Chen, Changlei Wang, Chang Liu, Xiangyang Kong, Jichun Ye, Chuanxiao Xiao

Institutions: Ningbo University, Chinese Academy of Sciences, Ningbo Institute of Industrial Technology, Soochow University, Collaborative Innovation Center of Suzhou Nano Science and Technology, Shanghai Jiao Tong University

Language: English

Topic: Perovskite Materials and Applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Ningbo Municipal Bureau of Science and Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences

Awards: G5588842876, G7233985304

OpenAlex ID: W4405815450

FWCI: 0.308

Cites: 47

Cited by: 3

Related to: 10