Integrating 3T-DRAM Into 1T Layout With Substrate Bipolar Effect Using 22 nm FDSOI Technology
Year: 2024
Type: article
Source: IEEE Electron Device Letters
Authors: Hui Xie, Jingya Cao, Rongshan He, Peng Zhou, Yu-Long Jiang, Yong Xu, Fanyu Liu, Jing Wan
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405844879
