Work

Influences of Adjacent High Voltage on the Characteristics and Reliability of SOI Power Devices for Automotive Application

Year: 2024

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2024.3520098

Authors: Ran Ye, Jiaojing Bian, Hao Luo, Qiao Kang, Siyang Liu, Long Zhang, Weifeng Sun, Li Lu, Chaoqi Xu, Penglong Xu, Feng Lin

Institution: Southeast University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G5620386573

OpenAlex ID: W4405845023

FWCI: 0.72

Cites: 25

Cited by: 7

Related to: 10