Reliability Assessment of Reconfigurable k -out-of- n Systems With Functional Dependency
Year: 2024
Type: article
Source: IEEE Transactions on Reliability
Authors: Yi-Xuan Zheng, Boyuan Zhang, Yu Liu
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G2955155357, G4155275895
OpenAlex ID: W4405845218
