Work

OCR is All you need: Importing Multi-Modality into Image-based Defect Classification System

Year: 2024

Type: conference-paper

Source: IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

DOI: 10.1109/apccas62602.2024.10808400

Authors: Chih-Chung Hsu, Chia-Ming Lee, Po-Tsun Yu, Chun-Hung Sun, Kuang-Ming Wu

Institutions: National Cheng Kung University, Advanced Semiconductor Engineering (Taiwan)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Cheng Kung University, National Science and Technology Council

OpenAlex ID: W4405845276

FWCI: 0.722

Cites: 21

Cited by: 1

Related to: 10