Work

A Radiation-Hardened Serial Peripheral Interface with an ECC-Protected SRAM in a 65nm CMOS Technology

Year: 2024

Type: conference-paper

Source: IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

DOI: 10.1109/apccas62602.2024.10808843

Authors: Ming-Hao Chang, Chansyun Yang, Yu-Ju Chuang, Herming Chiueh

Institutions: National Yang Ming Chiao Tung University, Industrial Technology Research Institute

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Industrial Technology Research Institute

OpenAlex ID: W4405845587

FWCI: 0.806

Cites: 13

Cited by: 1

Related to: 10