Work

In-Situ Temperature Measurement and Scanning Thermal Imaging Based on Micro-Nano QDs Fluorescence Near-Field Fiber Optic Probe

Year: 2024

Type: article

Source: Journal of Lightwave Technology

DOI: 10.1109/jlt.2024.3520505

Authors: Shaoying Li, Na Chen, Zhenmin Liu, Shupeng Liu, Yana Shang, Zhenyi Chen, Fufei Pang, Tingyun Wang

Institution: Shanghai University

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Higher Education Discipline Innovation Project

Awards: G1930164579, G4421024858, G7761274138

OpenAlex ID: W4405846492

FWCI: 0.52

Cites: 30

Cited by: 5

Related to: 10