Work

Defect size evaluation in eddy current testing through wavelet transform and pseudo-color enhancement

Year: 2024

Type: conference-paper

Source: International Workshop on Automation, Control, and Communication Engineering (IWACCE)

DOI: 10.1117/12.3052472

Authors: Shihao Dong, Zhengyu Ou, Cheng Xu, Jisong Cen, Zandong Han

Institutions: Tsinghua University, Ministry of Education of the People's Republic of China

Language: English

Topic: Non-Destructive Testing Techniques

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405900066

FWCI: 1.293

Cites: 36

Cited by: 1

Related to: 10