Work

Evaluation of the Impacts of Vth Variation and Leakage Current on the Signal-to-Noise Ratio of a Single-Shot HDR Image Sensor with a Lateral Overflow Transistor

Year: 2024

Type: conference-paper

Source: IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

DOI: 10.1109/imfedk64776.2024.10814182

Authors: Takaaki E. Murakami, Yasuyuki Shimoi, Tsutomu Kobayashi, Yoshihiro Sato

Institution: Panasonic (Japan)

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405907225

FWCI:

Cites: 4

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Related to: 10