Work

Electrical Characterization of Non-volatile Mott Transition in Mist CVD Deposited NiO Thin Films for CeRAM Applications

Year: 2024

Type: conference-paper

Source: IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

DOI: 10.1109/imfedk64776.2024.10814222

Authors: Mamoru Ikeda, Masamichi Azuma, Tsubasa Miyamoto, Hiroyuki Nishinaka

Institution: Kyoto Institute of Technology

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405907258

FWCI:

Cites: 2

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Related to: 10