Work

Characterization and Understanding of Cosmic Ray-Induced Soft Errors in SRAMs

Year: 2024

Type: conference-paper

Source: IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

DOI: 10.1109/imfedk64776.2024.10814208

Author: Masanori Hashimoto

Institution: Kyoto University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Japan Society for the Promotion of Science

OpenAlex ID: W4405907260

FWCI:

Cites: 38

Cited by:

Related to: 10