Work

A Novel Insight into Bulk Trap Generation at Cryogenic Temperatures

Year: 2024

Type: conference-paper

Source: IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

DOI: 10.1109/imfedk64776.2024.10814468

Authors: Y. Miyaki, T. Suzuki, Y. Mitani

Institution: Tokyo City University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405907475

FWCI:

Cites: 5

Cited by:

Related to: 10