Work

Evaluation of a BSIM4 Model at Cryogenic Temperature Using 65 nm Bulk Transistors

Year: 2024

Type: conference-paper

Source: IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

DOI: 10.1109/imfedk64776.2024.10814465

Authors: Shin Taniguchi, Michihiro Shintani

Institution: Kyoto Institute of Technology

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405907627

FWCI: 0.806

Cites: 6

Cited by: 1

Related to: 10