Work

Worst Case Analysis of Random Parameter Circuits or Devices via Taylor Models Method

Year: 2024

Type: conference-paper

Source: Cross Strait Radio Science and Wireless Technology Conference (CSRSWTC)

DOI: 10.1109/csrswtc64338.2024.10811631

Authors: Huaibin Wang, Tongyu Ding, Chong-Zhi Han, Ying Huang

Institution: Jimei University

Language: English

Topic: Numerical Methods and Algorithms

Subfield: Computational Theory and Mathematics

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405907899

FWCI:

Cites: 9

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Related to: 10