Work

High-Accuracy Online Junction Temperature Measurement of Medium-Voltage SiC MOSFETs Based on Passive Turn-On Delay Time Integrator

Year: 2024

Type: article

Source: IEEE Transactions on Power Electronics

DOI: 10.1109/tpel.2024.3518775

Authors: Jialong Dou, Zhiqiang Wang, Guoqing Xin, Xiaojie Shi

Institution: Huazhong University of Science and Technology

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G702100997

OpenAlex ID: W4405908058

FWCI: 0.625

Cites: 8

Cited by: 6

Related to: 10