Work

Temperature Coefficients for Impact Ionization in Silicon Derived From Temperature Coefficients of Avalanche Voltage

Year: 2024

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2024.3512477

Authors: Philipp Steinmann, Daniel Lichtenwalner, Suman Das, Jae Park, Shane Stein, Sei-Hyung Ryu

Institution: Wolfspeed, Inc. (United States)

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405908163

FWCI: 0.205

Cites: 11

Cited by: 2

Related to: 10