Work

Application of CNN and KNN Algorithms for Casting Defect Classification

Year: 2024

Type: conference-paper

DOI: 10.1109/icicec62498.2024.10808896

Authors: Shubham, Deepak Banerjee

Institution: Chitkara University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405908399

FWCI: 2.266

Cites: 17

Cited by: 3

Related to: 10