Work

High-Frequency Characterization of Optoelectronic Devices by Pilot-Assisted Harmonic Analysis

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Advanced Infocomm Technology

DOI: 10.1109/icait62580.2024.10807864

Authors: Ying Xu, Xinhai Zou, Junfeng Zhu, Zhiyao Zhang, Shangjian Zhang, Yong Liu

Institutions: University of Electronic Science and Technology of China, State Key Laboratory of Electronic Thin Films and Integrated Devices

Language: English

Topic: Advanced Photonic Communication Systems

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405908591

FWCI:

Cites: 14

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Related to: 10