Work

Measuring of Parasitic Inductances Through Resonance Effects in GaN Half-Bridges

Year: 2024

Type: conference-paper

Source: IEEE Design Methodologies Conference (DMC)

DOI: 10.1109/dmc62632.2024.10812127

Authors: Simon Holzmann, Kai Franck, Christian Schumann

Institution: University of Applied Sciences Kaiserslautern

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4405908809

FWCI: 1.612

Cites: 8

Cited by: 2

Related to: 10