Year: 2024
Type: conference-paper
Abstract: In this paper, we introduce a variation of the group testing problem where each test is specified by an ordered subset of items and returns the first defective item in the specified order or returns null if there are no defectives. The goal is to identify a small set of$K$defective items amongst a collection of size N, using as few tests as possible for perfect recovery. For the adaptive testing regime, we show that a simple scheme can find all defective items in at most$K$tests, which is optimal. For the non-adaptive setting, we first come up with a necessary and sufficient condition for any collection of tests to be feasible for recovering all the defectives. Using this, we show that any feasible non-adaptive strategy requires at least$\Omega(K^{2})$tests. In terms of achievability, it is easy to show the existence of a feasible collection of$O(K^{2}\log(N/K))$tests. We show via carefully constructed explicit designs that one can do significantly better for constant$K$. While the cases$K=1,2$are straightforward, the case$K=3$is already non-trivial and we come up with an iterative design that is asymptotically optimal and requires$\Theta(\log \log N)$, tests. Note that this is in contrast to standard binary group testing, where at least$\Omega(\log N)$tests are required. For constant$K\geq 3$, our iterative design requires only poly($\log \log N$) tests.
Institution: Indian Institute of Technology Bombay
Language: English
Subfield: Computational Theory and Mathematics
Field: Computer Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4405909453