Observation of morphological changes in silicon-based negative-electrode active materials during charging/discharging using Operando scanning electron microscopy
Year: 2024
Type: article
Source: Microscopy
Authors: Takako Kurosawa, Noriaki Fukumoto, Kaoru Inoue, Emiko Igaki
Institution: Panasonic (Japan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405911973
