Work

Observation of morphological changes in silicon-based negative-electrode active materials during charging/discharging using Operando scanning electron microscopy

Year: 2024
Type: article
Source: Microscopy
Institution: Panasonic (Japan)
Language: English
Open Access status: closed
OpenAlex ID: W4405911973
FWCI: 0.103
Cites: 10
Cited by: 1
Related to: 10