Improving Fault Device Identification Method using Alarm Clustering Approach
Year: 2024
Type: conference-paper
Authors: Yoichi Matsuo, Yuichi Suto, Yusuke Makino, Kazumich Sato
Institution: NTT (Japan)
Language: English
Subfield: Computer Networks and Communications
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405935634