Work

A Multi-Perspective Detection Head Aided YOLOv8 Algorithm Based on Adaptive Label Assignment for Semiconductor Laser Chip Defect Detection

Year: 2024

Type: conference-paper

DOI: 10.1109/acp/ipoc63121.2024.10809578

Authors: Jue Wang, Feng Tian, Jianwei Zhou, Yutian Li, Biao Luo, Fu Wang, Qinghua Tian, Qi Zhang

Institution: Beijing University of Posts and Telecommunications

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, National Key Research and Development Program of China

Awards: G2730134340, G8444469648

OpenAlex ID: W4405935786

FWCI:

Cites: 17

Cited by:

Related to: 10