Work

ESD Characterisation and Modelling of Digital Integrated Circuits Based on TLP Test

Year: 2024

Type: conference-paper

Source: IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications

DOI: 10.1109/mape62875.2024.10813843

Authors: Ying Chen, Zhaowen Yan, Changshun Fu, Siyi Xing, Jianhao Ge, Tengfei Gao

Institution: Beihang University

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G1347977995

OpenAlex ID: W4405935879

FWCI: 1.612

Cites: 1

Cited by: 2

Related to: 10