Work

Detection of Electronic Component Anomalies Through Data Mining

Year: 2024

Type: conference-paper

Source: International Conference on Integrated Circuits and Microsystems (ICICM)

DOI: 10.1109/icicm63644.2024.10814536

Authors: Hye Kang Park, Jang Hoo Lee, Jong Soo Sim, Ju Ho Park, Seung Jae Moon, Byung Seong Bae

Institutions: Hoseo University, Ulsan National Institute of Science and Technology

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Korea Institute for Advancement of Technology

OpenAlex ID: W4405936327

FWCI:

Cites: 6

Cited by:

Related to: 10