Work

High-Speed and High-Robustness ESD Protection Circuit for Monolithic GaN Integrated Chips

Year: 2024

Type: conference-paper

Source: IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications

DOI: 10.1109/mape62875.2024.10813748

Authors: Weijian Wang, Wen Yang

Institution: South China University of Technology

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405936559

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Cites: 12

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Related to: 10