Package Design and Reliability Verification of Spaceborne SiP
Year: 2024
Type: conference-paper
Authors: Zheng Yang, Jiemei Liang, Shenglong Li, Yingke Gao
Language: English
Topic: 3D IC and TSV technologies
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405937051
