Integrating Attention Mechanisms into YOLOv8 for Improved Defect Detection in Acceptance Environments on HoloLens 2
Year: 2024
Type: conference-paper
Authors: Yazhou Li, Hongjian Zhang, Feng Guo, Yonghui Chen, Yupeng Wang
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405937139
